Intel interview on Testing Methodologies for Zero Defect Semis

Semiconductors are enabling autonomous driving ecosystems by providing with high computing power microprocessors, which are capable of processing gigabytes of data quick & secure.

We are excited to share an expert interview regarding this topic with Nikhil Patil who works in Product Development at Intel. In the interview, Mr. Patil talks about Testing Methodologies for Zero Defect Semis.

Questions discussed:

What are the keys for semiconductor companies that want to reach Zero Defect standards?
What new types of testing methodology are/will become available to edge the industry closer to Zero Defect?
How the semiconductor industry is enabling the future of the automotive industry?
What are new challenges for the semiconductor industry?

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