State of the Art in LED Thermal Characterization

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Posted: 12/08/2013

INTRODUCTION

Using the JEDEC standard static test method for transient thermal measurements in accordance with JESD51-14 and CIE 127-2007 has increased the level of accuracy in light-emitting diodes (LEDs) thermal characterization. These higher standards have resulted in increased customer confidence and market share. In compliance with these standards, the Mentor Graphics T3Ster system can complete more than 100 LED thermal measurements in a single day, and it is the most accurate. The T3Ster post-processing software fully supports the latest thermal testing standard (JEDEC JESD51-14) for junction-to-case thermal resistance measurement. This paper discusses the importance of more accurate thermal characterization to the rapidly evolving marketplace and how the T3Ster and TERALED systems are meeting this challenge for lighting manufacturers and their customers.

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By:
Posted: 12/08/2013