September 30 - October 02, 2019 | INTERCONTINENTAL STEPHEN F. AUSTIN, Austin, TX
Joyce Witowski
Director Manufacturing Quality
NXP Semiconductors Inc.
Check out the incredible speaker line-up to see who will be joining Joyce.
Download The Latest AgendaConference Day Two
Monday, September 2nd, 2019
11:40 AM Panel Discussion | External Manufacturing Partnerships
Discussion between Tiers 1, Semiconductor companies, OEMs
• Partners as critical components of the manufacturing strategy
• Rigorous supplier assessments: Quality standards – monitoring – improvement program for zero defect strategy
12:20 PM Approaches for Semiconductor Front End Operations
Tier 1 suppliers to the Automotive market require zero defects from their semiconductor component manufacturers. Achieving true zero defects challenges semiconductor manufacturers to continually expand their ability to quickly and cost effectively identify outliers. Discussion of two exploratory approaches to complement the suite of tools commonly used to screen potential latent defects. Focus areas in this presentation include:
- Utilizing machine learning to correlate the characteristics of measured defects and mapped test responses to generate statistics that predict failure probability.
- Applying big data analytics techniques to the enormous volume of fab in-line and wafer test data to rapidly identify and correct root causes of observed variations that could lead to latent failures.