September 30 - October 02, 2019 | INTERCONTINENTAL STEPHEN F. AUSTIN, Austin, TX
Dr. Lieyi Sheng, Senior Member Technical Staff/ Quality & Reliability Director at ON Semiconductor
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Dr. Lieyi Sheng


Senior Member Technical Staff/ Quality & Reliability Director
ON Semiconductor

Check out the incredible speaker line-up to see who will be joining Lieyi.

Download The Latest Agenda

Conference Day One

Sunday, September 1st, 2019


9:10 AM Keynote Opening Presentation: Zero Defect in Semiconductors - the Challenges and our Strategic Pushes for Superiority

  • A reality check of defect immunity and challenges
  • Navigating the “Road to Zero Defects” at ON Semiconductor
  • A call for more collaborative endeavors towards zero defects assurance

11:40 AM Use Case; Tips for Zero Failures in Semiconductor Products

• Navigating along „Road to Zero Defects“
• How to proceed: Tips and Analysis

4:20 PM Integrated Workshop | Defects Screening Techniques at Product Sort

The workshop gives an insight in the Zero Defect Screening Techniques as failure analysis technology is not simply a means to investigate the failure causes and mechanisms of failed products. It is a vital and essential technology for quality and reliability improvement activities aimed at reducing failures in customer processes and the market to as close to zero as possible. The defect screening at product sort will help semiconductor manufacturers to adapt to the highest quality and reliability standards expected in the automotive market.