04 - 07 December, 2018
Germany

Workshop day

8:30 am - 9:00 am Registration for workshop C and welcome coffee

9:00 am - 11:30 am C - How to make functional safety affordable for complex multi core semiconductor devices - possible approaches and tradeoffs

The workshop will describe experiences in making functionally safe complex multi core semiconductor devices. It will include topics such as:
• How to leverage ASIL decomposition
• Asymmetric vs Homogenous redundancy
• How to handle legacy HW/SW
Riccardo Mariani, Chief Functional Safety Technologist at Intel

Riccardo Mariani

Chief Functional Safety Technologist
Intel

11:30 am - 12:30 pm Network luncheon and registration for workshop C

12:30 pm - 3:00 pm D - How to perform FMEDA on semiconductors

This workshop gives its attention to safety analysis for semiconductors, more precisely to a methodology for detailed determination of failure causes and their impact on the system. The Failure Modes,
Effects, Diagnostics Analysis (FMEDA) can be applied in an early stage of system development very efficiently, and is therefore highly appreciated.
• FMEDA as purely qualitative analysis – how to make a good brainstorming with engineers
• Use of reliability data to extract failure rates
• Focus on mixed signal analog
Rosario Martorana, Application Engineer at STMicroelectronics

Rosario Martorana

Application Engineer
STMicroelectronics

3:00 pm - 3:00 pm End of workshop day