15 - 18 June 2020 | Detroit, MI

Robert Jin

Senior Principal Engineer, Team Lead on Functional Safety Innovation NXP Semiconductors, USA

Xiankun “Robert” Jin is a Senior Principal Engineer at Automotive Microcontrollers and Processors group of NXP Semiconductors in Austin, Texas, United States. He is leading a small team working on a long-term innovation project towards automotive functional safety architecture for autonomous driving. He is also leading the implementation of an on-chip ADC BIST solution which is widely adopted within the company. Prior to that, he worked as an analog and mixed-signal test engineer, DFT lead and design engineer in microcontroller group of Freescale/Motorola since joining the company on 2002. His main topic of interest includes in-field test to enhance functional safety, on-chip analog BIST techniques to reduce test cost, and BIST based calibration to improve performance of analog modules. He received the M.S. degree in electrical engineering from University of Texas at Austin on 2013.

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