June 11 - 14, 2019 | Sheraton Ann Arbor Hotel, Ann Arbor, MI
Robert Jin, Senior Principal Engineer, Team Lead on Functional Safety Innovation at NXP Semiconductors, USA
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Robert Jin


Senior Principal Engineer, Team Lead on Functional Safety Innovation
NXP Semiconductors, USA

Agenda Day 1

Wednesday, June 12th, 2019


1:50 PM Making a case for test towards automotive safety

Making a case for test towards automotive safety
How does the test influence automotive safety for autonomous driving? This presentation
will review the links between them.
• The life journey of a semiconductor device
• Can built-in self-test be the answer?
• Top down vs. bottom up approach – find the sweet spot
Xiankun “Robert” Jin, Senior Principal Engineer, Team Lead on Functional Safety Innovation,
NXP Semiconductors

Check out the incredible speaker line-up to see who will be joining Robert.

Download The Latest Agenda