Senior Principal Engineer, Team Lead on Functional Safety Innovation NXP Semiconductors, USA
“Robert” Jin is a Senior Principal Engineer at Automotive Microcontrollers and
Processors group of NXP Semiconductors in Austin, Texas, United States. He is
leading a small team working on a long-term innovation project towards
automotive functional safety architecture for autonomous driving. He is also
leading the implementation of an on-chip ADC BIST solution which is widely
adopted within the company. Prior to that, he worked as an analog and mixed-signal
test engineer, DFT lead and design engineer in microcontroller group of
Freescale/Motorola since joining the company on 2002. His main topic of
interest includes in-field test to enhance functional safety, on-chip analog
BIST techniques to reduce test cost, and BIST based calibration to improve
performance of analog modules. He received the M.S. degree in electrical
engineering from University of Texas at Austin on 2013.
Check out the incredible speaker line-up to see who will be joining Robert.