Interview with Jyotika Athavale from Intel on ISO 26262 for Semiconductors and System Level Radiation Testing for Safety Critical Platforms

Interview with Jyotika Athavale from Intel on ISO 26262 for Semiconductors and System Level Radiation Testing for Safety Critical Platforms

Jyotila Athavale, Principal Engineer Senior Functional Safety and RAS Architect at Intel Corporation, explains how System Radiation Testing helps to accurately model transient reliability for safety critical platforms compared to the traditional methodology of bottom-up individual component characterization. Download this exclusive article to learn more. 


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