Main Conference Day Two

8:30 am - 9:00 am Registration and welcome coffee

9:00 am - 9:10 am Opening remarks by Chairman

Riccardo Mariani, Chief Functional, Safety Technologist, Intel

9:10 am - 9:50 am The ELISA Project: Enabling Linux in Safety

The market is increasingly interested in deploying Linux as safety element within safety critical systems. The Enabling Linux In Safety Applications (ELISA) project will be presented in this speech.
• The ELISA project scope
• Envisioned approach
• Key challenges in defining a common tool set and processes

9:50 am - 10:30 am How can Automotive SPICE Support Compliancy to ISO 26262 Part 6?

ISO 26262 part 6 refers to Automotive Software Performance Improvement and Capability dEtermination (ASPICE).
• Overview of Automotive SPICE and its assessment model
• Comparison between ASPICE vs ISO 26262 processes
• What is not covered with ASPICE and vice versa?
• QM system based on ASPICE to support compliancy to ISO 26262 part 6

10:30 am - 11:10 am Lessons Learned Integrating Artificial Intelligence (AI) / Machine Learning (ML) Accelerators into Complex ISO 26262-Compliant Systems-On-Chip

Kurt Shuler - Vice President of Marketing , ArterisIP
Diego Botero - Corporate Applications Engineer & Functional Engineer, Arteris IP
Describes lessons learned and best practices for integrating AI / ML hardware accelerators and processing elements into ADAS and autonomous driving SoCs using Network-on-Chip (NoC) interconnects.
• Integrating legacy hardware accelerators that have no/limited safety mechanisms into systems with an ASIL
• Protecting interfaces, protocols and signaling
• Accelerator subsystem checking, isolation, and other integration issues


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Kurt Shuler

Vice President of Marketing
ArterisIP

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Diego Botero

Corporate Applications Engineer & Functional Engineer
Arteris IP

11:10 am - 11:40 am Refreshment break and networking

11:40 am - 12:20 pm The Challenges of Heterogeneous Redundancy in ISO 26262

Redundancy is a hallmark of fail-operational systems. But, how do you ensure that you are deploying redundancy effectively? In this session, we will examine the impact of homogeneous and heterogeneous redundancy on project development costs. We will consider both hardware and software aspects. At the end, you will learn how the different types of redundancy can be used synergistically to efficiently manage the risks of both random and systematic failures. 

12:20 pm - 1:00 pm Software-Based Self-Test Techniques for the On-Line Testing of Automotive SoCs

Software-Based Self-Test (SBST) is an effective methodology for devising the on-line testing of Systems-on-Chip. In the automotive field, a set of test programs to be run during mission mode is also called Core Self-Test (CST) or Soft-BIST (SW-BIST) or Software Test Library (STL). This talk will describe the major advantages of this technique and discuss the costs.
• Working principle of Software-Based Self-Test (SBST)
• In-Field Application of SBST procedures
• Cases of study

1:00 pm - 2:30 pm Networking luncheon

2:30 pm - 3:10 pm At the Crossroads of Safety and Security

This presentation will discuss the relationship between Functional Safety and CyberSecurity in complex automotive components. It will consider some of the challenges of effectively mitigating the effects of failures, both accidental and intentional.

3:10 pm - 3:50 pm Out of the box: System Level Radiation Testing for Safety Critical Platforms

System-level radiation testing guidance for space, avionics and ground applications continues to be an important area of focus with increasing performance demands driving larger quantities of COTS technologies (e.g., automotive, industrial, medical, etc.) into equipment. Radiation testing methodology and recommendations for mitigation at system level with focus on requirements for RAS sensitive and safety critical systems, such as automotive, industrial robotics, comms and avionics systems will be very valuable. Reduced beam time and cost are key considerations. System level testing inclusion in design process, standards methodologies, KPI definition and data portability should be investigated.

3:50 pm - 4:20 pm Refreshment break and networking

4:20 pm - 5:50 pm Town Hall Session with working group members of the international ISO 26262 working group (ISO/TC 022/SC 32/WG 08 Functional safety)

with working group members of the international ISO 26262 working group (ISO/TC 022/SC 32/WG 08 ″Functional safety″)

Meet ISO 26262 working group Committee Members and get the opportunity to clarify doubts in this open session. Participants will be asked to choose two from the six tables available, each one moderated by an expert who specializes in a specific section of ISO 26262. There are 30 minutes dedicated to each table which participants choose.
4:30 – 5:00 pm | First Session
5:00 – 5:10 pm | Time for Switching
5:10 – 5:40 pm | Second Session
5:40 – 5:50 pm | Summary of main discussion points by discussion leaders

6:00 pm - 6:15 pm Closing remarks by Conference Chairperson and end of main conference


6:30 pm - 7:00 pm Registration for workshop A and B

Workshops

ISO 26262 for automotive

7:00 pm - 9:00 pm Workshop A | FROM FUNCTIONS TO FUNCTIONAL SAFETY MECHANISMS
John Lindland - Director of Functional Safety, TuSimple
Focus: ISO 26262 Parts 4,5 & 6

• Documenting the time sequence of functions from scope inputs to scope outputs
• Sequential Relationship Between Functions. Selecting potential failure modes and primary failure modes
• Identifying a failure mode detection strategy and functional safety response
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John Lindland

Director of Functional Safety
TuSimple

ISO 26262 for semiconductor

7:00 pm - 9:00 pm Workshop B | SAFETY ANALYSIS IN SOFTWARE
Russ Mohr - Functional Safety Manager, FLIR Systems
Focus: Specification of software safety requirements for semiconductors

Around 80% of today’s innovation on the vehicle are based on software. Software becomes – or is already – a big differentiation factor within the automotive world. More than ever before, we should now focus on achieving high safety levels for software at possibly low cost. Discussion topics will include interpretation of ISO 26262 chapter 6 for semiconductors, Failure Modes and Effects Analysis (FMEA) for software and software validation.
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Russ Mohr

Functional Safety Manager
FLIR Systems