June 11 - 14, 2019 | Sheraton Ann Arbor Hotel, Ann Arbor, MI

Agenda Day 2

8:30 am - 9:00 am Registration and welcome coffee

9:00 am - 9:10 am Opening remarks by Chairman

Riccardo Mariani, Chief Functional, Safety Technologist, Intel

APPLICATION OF REAL WORLD EXAMPLES

9:10 am - 9:50 am Practical Application of ISO 26262 Part 11

Gustavo Espinosa, Senior Principal Engineer, Lead Architect for Functional Safety, Intel Corporation

9:50 am - 10:30 am Panel Discussion | Systems engineering &how the industry can adapt – OEM, Tier1 & Semiconductor

Moderator:
Rahul Gulati, SoC Functional Safety Architect, Qualcomm

Panelists:
Nestor Grace, Electrical Architect & Vehicle Systems Engineer, Faraday Future
Charles Gu, Autonomous Vehicle System Safety Engineer, General Motors Company
Scott Wendling, Technical Manager - Safety and Software, Halla Mechatronics

10:30 am - 11:00 am Refreshment break and networking

BASE FAILURE RATE FOR SEMICONDUCTORS

11:00 am - 11:40 am Safety analysis - How to better integrate a FMEDA in the Tier1 system level

Lisa Clark, Functional Safety Manager, Veoneer

11:40 am - 12:20 pm Applying Reliability Physics Analysis to Achieve Reliability and Safety in Automotive Electronics

James McLeish, Automotive Technical Expert & Senior Member of Technical Staff Senior
Reliability/Test Engineer, DfR Solutions - Southeast Michigan Automotive Office
Keith Hodgson, Subject Matter Expert for E/E Reliability-Durability, Ford Motor Co

12:20 pm - 12:50 pm Achieving a Traceable Design and IP Methodology for ISO 26262 Compliance

While solutions exist for traceability for requirements, design and verification, these solutions are often not connected and error prone when information attempts to be shared. This presentation will discuss:
• How to automate traceability from requirements through design to verification
• Automating the documentation of the traceabiity

Michael Munsey, Vice President Corporate Strategy and Business Development, Methodics Inc.

12:50 pm - 1:50 pm Networking luncheon

ADAS & SEMICONDUCTORS

1:50 pm - 2:30 pm Panel Discussion | Safety requirements & expectations

Moderator:
Riccardo Mariani, Chief Functional, Safety Technologist, Intel

Panelists:
Michael Ryzyi, Principal Engineer Functional Safety, Lear
Scott Wendling, Technical Manager - Safety and Software, Halla Mechatronics

2:30 pm - 3:10 pm Autonomous driving and its impact on automotive safety development

Frank Noha, Safety Specialist, NVIDIA

3:10 pm - 3:40 pm Refreshment break and networking

3:40 pm - 4:20 pm Link Safety & cyber security

Chanthachith Souvanthong, Corporate Functional, Safety Manager, ON Semiconductor

4:20 pm - 4:45 pm Lessons Learned from Fault Injection of Complex System-on-Chip Interconnects

Describes lessons learned and methods to validate the presence and functionality of SoC safety mechanisms using fault injection. Describes best practices for:
·Fault simulator setup and integration with interconnect verification environments and testbenches
·Selecting insertion and observation points in RTL and netlists
·Reporting and tracing results back to the design implementation

Kurt Shuler, Vice President of Marketing & Functional Safety Manager, Arteris IP, USA


4:45 pm - 5:25 pm Design Tools Classification and Qualification in a Safety Related Environment

Mauro Pipponzi, Intel Functional Safety Tools, Flows and Methodologies Architect, Intel Corporation
Kevin Conz, Program Manager, Intel

5:25 pm - 5:35 pm Closing remarks by Chairman

Riccardo Mariani, Chief Functional, Safety Technologist, Intel

5:35 pm - 5:35 pm End of conference see you in 2020