Agenda Day 2
8:30 am - 9:00 am Registration and welcome coffee
9:00 am - 9:10 am Opening remarks by Chairman
Riccardo Mariani, Chief Functional, Safety Technologist, Intel
APPLICATION OF REAL WORLD EXAMPLES
9:10 am - 9:50 am Practical Application of ISO 26262 Part 11
Gustavo Espinosa, Senior Principal Engineer, Lead Architect for Functional Safety, Intel Corporation
9:50 am - 10:30 am Panel Discussion | Systems engineering &how the industry can adapt – OEM, Tier1 & Semiconductor
Moderator:
Rahul Gulati, SoC Functional Safety Architect, Qualcomm
Panelists:
Nestor Grace, Electrical Architect & Vehicle Systems Engineer, Faraday Future
Charles Gu, Autonomous Vehicle System Safety Engineer, General Motors Company
Scott Wendling, Technical Manager - Safety and Software, Halla Mechatronics
10:30 am - 11:00 am Refreshment break and networking
BASE FAILURE RATE FOR SEMICONDUCTORS
11:00 am - 11:40 am Safety analysis - How to better integrate a FMEDA in the Tier1 system level
Lisa Clark, Functional Safety Manager, Veoneer
11:40 am - 12:20 pm Applying Reliability Physics Analysis to Achieve Reliability and Safety in Automotive Electronics
James McLeish, Automotive Technical Expert & Senior Member of Technical Staff Senior
Reliability/Test Engineer, DfR Solutions - Southeast Michigan Automotive Office
Keith Hodgson, Subject Matter Expert for E/E Reliability-Durability, Ford Motor Co
12:20 pm - 12:50 pm Achieving a Traceable Design and IP Methodology for ISO 26262 Compliance
While solutions exist for traceability for requirements, design and verification, these solutions are often not connected and error prone when information attempts to be shared. This presentation will discuss:
• How to automate traceability from requirements through design to verification
• Automating the documentation of the traceabiity
Michael Munsey, Vice President Corporate Strategy and Business Development, Methodics Inc.
12:50 pm - 1:50 pm Networking luncheon
ADAS & SEMICONDUCTORS
1:50 pm - 2:30 pm Panel Discussion | Safety requirements & expectations
Moderator:
Riccardo Mariani, Chief Functional, Safety Technologist, Intel
Panelists:
Michael Ryzyi, Principal Engineer Functional Safety, Lear
Scott Wendling, Technical Manager - Safety and Software, Halla Mechatronics
2:30 pm - 3:10 pm Autonomous driving and its impact on automotive safety development
Frank Noha, Safety Specialist, NVIDIA
3:10 pm - 3:40 pm Refreshment break and networking
3:40 pm - 4:20 pm Link Safety & cyber security
Chanthachith Souvanthong, Corporate Functional, Safety Manager, ON Semiconductor
4:20 pm - 4:45 pm Lessons Learned from Fault Injection of Complex System-on-Chip Interconnects
Describes lessons learned and methods to validate the presence and functionality of SoC safety mechanisms using fault injection. Describes best practices for:
·Fault simulator setup and integration with interconnect verification environments and testbenches
·Selecting insertion and observation points in RTL and netlists
·Reporting and tracing results back to the design implementation
Kurt Shuler, Vice President of Marketing & Functional Safety Manager, Arteris IP, USA
4:45 pm - 5:25 pm Design Tools Classification and Qualification in a Safety Related Environment
Mauro Pipponzi, Intel Functional Safety Tools, Flows and Methodologies Architect, Intel Corporation
Kevin Conz, Program Manager, Intel
5:25 pm - 5:35 pm Closing remarks by Chairman
Riccardo Mariani, Chief Functional, Safety Technologist, Intel