Conference Chairman
Riccardo Mariani,
Intel Fellow,
Functional Safety,
Intel Corporation

As part of Automotive IQ’s Safety and Security Series, this conference will tackle safety challenges of the semiconductor by

  •  Sharing the latest updates on ISO/DIS 26262:11 for competitive edge in functional safety
  •  Discussing improvements of the semiconductor usage in safety-critical systems for higher integrity level
  •  Discovering innovations in highly automated driving that the semiconductor sector can benefit from
  •  Addressing confidence issues in the use of software tools specifically designed for semiconductors challenges
  •  Analysing fault injection tools to support safety analysis
  •  Finding diverse approaches to bundle analysis results into a comprehensive manual

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Featured Speakers

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Featured case studies:

Failure Mode Distribution – A frequently discussed topic without a standard solution

The ISO 26262 does not provide a best practice for distributing failure modes, especially when talking about semiconductors. Therefore, a detailed analysis of all safety-related blocks upon their failure modes shall be performed as a preparative step for an FMEDA.

Implementation challenges for coexistence of safety and security related applications within an Automotive MCU/SoC

While safety measures such as End-to-End protection are well-established for in-vehicle communication, security measures are rapidly becoming an additional and a mandatory design requirement. The challenge of addressing combined automotive safety and security use-cases will be discussed and Best Practice examples provided. - Renesas

Challenges related to autonomous driving and how ISO 26262 (and its new part 11) can help

Autonomous driving is a reality with several automation levels being addressed today. However, ISO26262, even in its 2nd edition, has constraints to respect and cannot always help.

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